FT-IR technology has been widely adopted as a powerful analytical tool for non-destructive identification and characterization of both organic and inorganic materials, including additives and contaminants. Nevertheless, the standard FT-IR “bench” platform has limitations for the analysis of very small samples or those that have defects that are not readily visible to the eye. Infrared microscopy allows the investigation of minuscule samples that are otherwise too challenging for the FT-IR bench, delivering high quality spectral data for samples smaller than the width of a human hair. This PerkinElmer webcast will describe fundamental principles, capabilities, and sampling techniques used for infrared microscopy, along with some practical examples.
Key Learning Objectives:
- Learn the basic concepts of IR microscopy and how the measurement is performed
- Learn more about applications of IR microscopy.