Next-Generation Cartesian Geometry Energy Dispersive X‑ray Fluorescence Spectrometers Enhanced elemental analysis for industrial quality control to advanced research applications NEX CG II Series are powerful second-generation energy dispersive X-ray fluorescence (EDXRF) spectrometers that deliver rapid qualitative and quantitative determination of major and minor atomic elements in a wide variety of sample types—from oils and liquids to solids, metals, polymers, powders, pastes, coatings, and thin films.

Affordable, Compact Benchtop EDXRF Spectrometers

Rapid, non-destructive qualitative and quantitative elemental analysis

Elemental analysis techniques can be expensive and time-consuming. The NEX QC Series EDXRF analyzers put the power of elemental analysis within reach for any lab, facility, or field application. They offer exceptional value, providing a cost-effective solution for analyzing a wide range of sample types, including solids, liquids, powders, and thin films, adapting seamlessly to your needs. The NEX QC Series delivers results in minutes and the systems are easy to operate, which is ideal for busy labs and fast-paced environments. With a compact, space-saving design, you can streamline your workflow and maximize your workspace. Explore the NEX QC, NEX QC+, and NEX QC+ QuantEZ models and find the perfect fit for your needs.

High-performance Direct Excitation EDXRF Spectrometers

Powerful, non-destructive qualitative and quantitative elemental analysis

The Rigaku NEX DE Series are high-performance, direct excitation EDXRF spectrometers that deliver exceptional elemental analysis capabilities. Utilizing a high-powered X-ray tube, these instruments provide superior analytical performance, including higher count rates, improved precision, and the ability to analyze even challenging materials with ease. This versatility allows the NEX DE Series to address a wide range of applications, from demanding quality control needs to those requiring small spot analysis. The series includes NEX DE and NEX DE VS.